CRC 951/3: Enabling High-Resolution Imaging and Spectroscopy of Electron Beam Sensitive Hybrid Material Systems (SP A12)

The very special opto-electronic properties of hybrid inorganic/organic systems (HIOS) being investigated within this CRC are largely determined by the electronic structure and distribution of charges at the inorganic/organic interface. Holographic imaging techniques in transmission electron microscopy allow electrostatic potentials, electric fields, and charge distributions to be imaged. State of the art electron energy-loss spectroscopy available to this project provides a sub-nanometer-sized probe of the electronic structure with approximately 5 meV energy resolution. Novel techniques based on both of these principles will be developed to minimize the electron beam damage to the sample. Beam-sensitive HIOS will then be characterized to reveal maps of charge density and local dielectric function that can be compared to theory.